Steve:
I am a bit confused on your answer. Do you mean to say that a small number of out-of-control product close together will cause a signal rather than "defects".
The time between defects can be much more sensitive (and effective) in detecting a change in defect rate rather than simply counting defects per time interval. See https://www.hanford.gov/rl/uploadfiles/VPP_TrendLow-Rate.pdf for an example which I took from Dr. Wheeler's book "Understanding Variation - the Key to Managing Chaos" (a very good introductory book on SPC, I recommend it highly).