Some thoughts:
From: "Wayne Lundberg"
Newsgroups: misc.industry.quality
Subject: Re: what is Cpk ?????????
Date: Thu, 18 Jan 2001 01:13:22 GMT
"Jed Palmer" wrote in message
news:
[email protected]...
> The term Cpk is used in statistical techiniques. Could someone tell me what
> it actually means, and any other helpful information would be gratefully
> received.
>
> Jed
What it boils down to - is your process capable of making the parts within the required tolerances. If your part must be half inch plus or minus 5 thousandths, then a Cpk of 100 would mean that you should make parts within those tolerances day in and day out as long as the process is under control. So a lot of buyers are demanding 120 or more Cpk which means your system is 120% (roughly) capable of making the parts within tolerance. Then add to this the three and six sigma stuff and it really gets confusing.
Bottom line - make sure your process can make the required tolerances within the one sigma of 68% and will never go to the second or third sigma. Fine tune, adjust, maintain, fine tune, adjust and maintain process control. That's how you get zero defects.
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From: "Michael Schlueter" philips.com
Newsgroups: misc.industry.quality
Subject: Re: what is Cpk ?????????
Date: Thu, 18 Jan 2001 13:52:24 +0100
Organization: Customer of UUNET Deutschland GmbH
A practical tool to make this process a success is utilizing Taguchi's method.
A warning: do not try to optimize on Cpk. Do not even think to do so. Optimize your intended result instead.
Example: Assume you have to manufacture weights of different masses. You could *monitor* this process by monitoring its Cpk's. To improve the process itself, you should compare "intended mass (x-axis)" with "manufactured mass (y-axis)". If your process works fine, you will have a straight line, with slope 1.00 and very little deviation from the linear curve (intended result). If you have problems you will see it as deviation from this linear case (symptoms, unwanted conditions).
Taguchi provides a signal-to-noise ratio (SNR=10*lg(beta^2/sigma^2)) for these kinds of problems. The objective is to increase SNR. This means in turn: reduce sigma down to zero. If you read all equations properly you will see that Cpk-improvement is very closely related to SNR-improvement. The difference between SNR and Cpk is simple: SNR is known to be more predictable.
That is, if you change one parameter, which will increase SNR and another, which will also increase SNR, you can expect that both changes together will increase SNR even more. Look for "Parameter Design" in your library. Parameter Design helps you also to avoid a common (fatal) 'game': adjust tolerances with respect to measured process spread to 'improve Cpk'. It is just vice versa: fix tolerances, even narrow down tolerances and drive sigma towards zero, while increasing Cpk.
Michael Schlueter